The technique of X-Ray diffraction utilizes an
X-ray beam to probe a sample. The incident X-rays are directed
towards a slowly tilted sample. At characteristic angles (i.e.,
Bragg angles), a given crystalline sample (organic or inorganic)
will diffract the beam. Based on the resulting diffraction
pattern, the material can be identified. Although powder
diffraction is typically limited to larger amounts of sample; new
sample preparation methods make analysis of smaller amounts of
sample feasible.
Pictured above is the Rigaku
MiniFlex Powder X-Ray Diffractometer